Cadence's Encounter® Test using Encounter RTL Compiler global synthesis inserts a complete test infrastructure to assure high testability while reducing the cost-of-test with on-chip test data compression.
The high-level solution highlights of Cadence Encounter® Test can also be described as follows:
"Testability" has become a critical concern for ASIC designers. Design for Test (DFT) techniques provide measures to comprehensively test the manufactured device for quality and coverage. One of the main DFT techniques or Encounter® Test solution components available today is Logic built-in self-test (LBIST). The LBIST is inserted into a design to generate patterns for self-testing. LBIST allows for field/system testing without the need for automated test equipment (ATE) and at times it is used during wafer/burn-in testing. Cadence Encounter® RTL Compiler provides an automated way to insert LBIST logic, while Cadence Encounter® Test provides support to generate the patterns and observe the responses.
Now the question is how quickly to find the right learning vehicle that helps discover what one doesn't already know. Rapid Adoption Kits (RAKs) from Cadence help engineers learn foundational aspects of Cadence tools and design and verification methodologies using a "DIY" approach. Application notes, tutorials and videos also help develop a deep understanding of the subject.
Keeping this need in mind, Cadence Encounter® Test and RTL Compiler product development teams, in February 2014, developed a RAK that introduces the concepts of LBIST used to test logic test structures. The RAK covers the insertion of structured test logic into the digital portion of multiple designs using RTL Compiler, running LBIST Signature Generation and Automatic Test Pattern Generation (ATPG) using Encounter Test, running simulation with ncsim (IES), and Conformal LEC Verification.
At the end of this RAK, you should be able to:
You can download your copy by clicking a link below, and use your Cadence credentials to log on to the Cadence support website.
Rapid Adoption Kits
Encounter Test and RTL Compiler: Logic Built-In-Self-Test (LBIST)
Download (6 MB)
We are covering following technologies through our RAKs at this moment:
Synthesis, Test and Verification flow Encounter Digital Implementation (EDI) System and Sign-off Flow Virtuoso Custom IC and Sign-off Flow Silicon-Package-Board Design Verification IP SOC and IP level Functional Verification System level verification and validation with Palladium XP
Please keep visiting http://support.cadence.com/raks to download your copy of RAK.