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Hello everybody,I've a stacked (4x die) IBIS model for my device. During the operation one device is active at a time. Each die has a different capacitance (c_comp) however R_pkg, L_pkg & C_pkg should be the same. How will I set c_comp in the IBIS model as it is a variable parameter?Thanks,Saad.
Using the IBIS keyword [Model Selector] might do the trick for you.
[Pin] signal_name model_name R_pin L_pin C_pin
A1 IO1 StackIO
[Model Selector] StackIO
Die1_IO IO for first die
Die2_IO IO for second die
Die3_IO IO for third die
Die4_IO IO for fourth die
Vinl = 650.000mV
Vinh = 1.150V
Vmeas = 900.000mV
Vref = 900.000mV
Cref = 0.0pF
Rref = 25.000Ohm
| typ min max
C_comp 2.690pF 2.290pF 3.070pF
|...Then from Sigxp you could select which buffer to use in the simulation.
Aaront's approach or something similar is the only way to go. In SigXP, you can chose the buffer easily. If you want to run lists of nets in probe, you have to run several batch jobs using the different model cases.
thanks Aaront, thanks Kai for your help!Regards Saad.
Clever trick for swapping drivers, but it seems you should also 4x C_comp too?