Cadence Modus DFT at International Test Conference 2017

While DAC is the focal point for the EDA industry, the test community travels in a slightly separate orbit. There are many conferences throughout the year, and around the globe, to help bridge the problems and solutions in academia and the industry. The most prestigious one is the International Test Conference (ITC). 

This year’s ITC was held in Fort Worth, TX, and was a week-long event featuring the best work and current challenges in the test community. Major themes for the conference and in customer discussions were automotive test requirements, analog fault simulation, system level test, diagnostics role in root cause and yield ramp, and the impact of test logic in physical design convergence.

Cadence’s presence and impact at the test conference has grown recently, following the growth of Cadence full flow digital solutions, and the launch of Modus DFT Software Solution in 2016.   Cadence was a Platinum Sponsor of the 2017 conference.  Modus’ patented 2D Elastic compression was a focal paper at the conference, given to a standing room only crowd, with lots of spirited discussion following.

In addition to participating in the technical tracks, Cadence met with several prospective and current customers in private discussions, and sponsored a popular gourmet coffee cart for the conference attendees.  

The highlight of the conference was the annual customer event, held at Thompson’s Speakeasy. The evening was a good mixing of customers, ecosystem partners, and Cadence R&D, in a room hidden behind a book case.

Work is already underway for next year’s ITC in Phoenix, AZ!

Cadence participation at ITC 2017: 

Tuesday, October 31

• Poster: BIST On-Demand Using Distributed On-Chip Programmable Data Streams
• Paper: Diagnosis, High-Throughput Multiple Device Diagnosis System

Wednesday, November 1

• Session 5: Cell and Bridging ATPG
• Session 9: Delay Test and Quality
• Corporate Forum, Cadence Modus DFT Software Solution
• Session 10: DFT Architectures and Compression, Advancing Test Compression to the Physical Dimension

Friday, November 3

• Paper: BIST On-Demand Using Distributed On-Chip Programmable Data Streams

For more information on the Cadence Modus DFT Software Solution visit the product page here or for more event details visit our event page.

We hope to see you next year at ITC 2018, in Phoenix October 30th to November 2nd.