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Simulation of LPDDR4X Interface: What Designers Need to Know and Do

By Sigrity | 21 Feb 2019

System designers are familiar with standard DDR4 RAM components but with the demands on increasing performance and decreasing power consumption in mobile products, LPDDR4 and its variation, LPDDR4X, have become the desired memory devices for in-vehi...

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Serial link analysis | SI | LPDDR4 | DesignCon | DesignCon 2019 | signal integrity | Channel simulation | Sigrity | BER | SystemSI
Verifying Power Intent in Analog and Mixed-Signal Designs Using Formal Methods

By msteam | 21 Feb 2019

Analog and Mixed-signal (AMS) designs are increasingly using active power management to minimize power consumption. Typical mixed-signal design uses several power domains and operate in a dozen or more power modes including multiple functional, standby and test modes. To save power, parts of design...

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AMS | Virtuoso Schematic Editor | Low Power | virtuoso power manager | Virtuoso-AMS | mixed signal design | mixed signal solution | Virtuoso | low-power design | mixed signal | mixed-signal verification
Virtuosity: A Smart Extracted View

By Arja H | 21 Feb 2019

The Cadence Quantus Smart View is the next generation of the Extracted View in the Virtuoso environment. The Smart View provides the same functionality as the Extracted View, but it uses a highly efficient and scalable storage mechanism. This means that Smart View can manage larger, more complex designs...

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Smart View | PAD | ICADVM18.1 | ADE Explorer | Virtuoso | Virtuosity | Quantus | IC6.1.8 | parasitics | ADE Assembler | Virtuoso Layout Suite XL
Who Is Green Hills?

By Paul McLellan | 21 Feb 2019

Cadence announced during their recent quarterly earnings announcement and call that we are acquiring approximately 16% ownership in Green Hills Software for about $150M. Lip-Bu Tan, Cadence's CEO, joined their board of directors. Talking of Green Hi...

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vast systems technology | Integrity | embedded software | Green Hills | Virtutech
Pattern Technology Applied to Machine Learning-based Hotspot Prediction

By Philippe Hurat | 20 Feb 2019

I have been working on DFM solutions for (too) many years and the objective hasn’t change: Detect or predict design-process weakpoints also known as hotspots, to limit systematic yield loss in semiconductor manufacturing. Traditional methods, c...

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pattern analysis | machine learning | silicon learning | signoff | yield | design for manufacturing | DFM