Master ATPG with Modus 26.1: AI-Assisted DFT, Smarter Diagnostics

The world of Design-for-Test continues to evolve, and Modus v26.1 introduces powerful innovations designed to help engineers achieve faster test generation, improved diagnostics, and enhanced silicon insight. From the new Modus AI Assistant and advanced iJTAG verification capabilities to enhanced ATPG, LBIST, and diagnostics workflows, this 26.1 release delivers features that improve both productivity and test quality.

AI-Powered Assistance Inside Modus

One of the standout additions in Modus 26.10 is the Modus AI Assistant , an integrated chatbot embedded within the GUI. Powered by Cadence Agentic AI infrastructure, it allows users to interact with documentation and product knowledge directly from the design environment, improving productivity and reducing time spent searching through manuals.

Why ATPG Debug Matters More Than Ever

Modern SoCs contain millions of scan cells distributed across multiple clock domains and hierarchical blocks. When scan chain connectivity issues occur, engineers need more than basic reporting. They need intelligent visibility, rapid tracing, and efficient debugging workflows.

The ATPG Flow training teaches participants how to:

• Build and verify test models
• Create and manage test modes
• Verify test structures before ATPG execution
• Generate scan, logic, delay, bridging, and IDDQ tests
• Analyze failures and debug scan chain issues efficiently

Broken Scan Chain Debugging

One of the most valuable additions emphasized in the latest training is broken scan chain debugging, a critical skill for ATPG and DFT engineers.

The course demonstrates a structured debugging methodology that helps engineers quickly isolate and resolve scan chain failures:

• Identify the broken scan chains: Using chain reporting utilities, engineers can quickly locate problematic controllable or observable scan chains and determine which chain is failing. The training demonstrates how chain summaries reveal broken scan paths and guide further investigation.

• Locate the last good flop: Once the broken chain is identified, Modus enables engineers to focus on the specific chain and find the last valid scan element recognized in the chain. This dramatically narrows the debugging scope and reduces analysis time.

• Find the faulty instance: Depending on whether the failure occurs in a controllable or observable chain, engineers learn to trace forward or backward through the scan path to pinpoint the exact connectivity issue. This systematic approach helps eliminate guesswork during debug.

• Trace and resolve the failure: Debugging does not stop identifying failures. The training also demonstrates how Modus integrates with waveform analysis environments to provide deeper insight into scan behavior.

Advanced Analysis with SimVision Integration

Debugging does not stop identifying failures. The training also demonstrates how Modus integrates with waveform analysis environments to provide deeper insight into scan behavior.

More About ATPG Flow with Modus Training

In this ATPG Flow with Modus DFT Software training, we'll explore the complete ATPG Flow with Modus, while showcasing the latest Modus 26.1 enhancements that enable smarter test generation, streamlined debugging, and more efficient root-cause analysis. Whether you're working on scan, compression, Logic BIST, hierarchical test, or silicon diagnostics, you'll learn how to leverage these new capabilities to accelerate DFT closure and silicon bring-up.

• Discover the latest Modus 26.1 features
• Learn best practices for ATPG flow
• Explore AI-powered productivity enhancements
• Understand advanced diagnostics and debug capabilities
• Improve coverage, quality, and turnaround time
  

Whether you are a DFT engineer, ATPG specialist, validation engineer, or silicon debug professional, this course will help you gain practical expertise in modern ATPG methodologies while exploring the newest features available in Modus 26.1. Learn how Cadence continues to innovate with AI-assisted workflows, enhanced diagnostics, and advanced test technologies designed for next-generation semiconductor devices.

Register for the Online Training with the following steps:

• Log on to cadence.com with your registered Cadence ID and password
• Select Learning from the menu > Online Courses
• Search for "Functional safety implementation and verification" using the search bar
• Select the course and click "Enroll"

Happy learning!