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In this week's Whiteboard Wednesdays video, Scan Compression reduces the digital IC test time and data volume by orders of magnitude, but the technology’s limitations prevent achieving higher compression ratios. Distinguished engineer Rohit Kapur explains the different limiters of compression QoR and impact on scan design. To learn about the Cadence Modus DFT Software Solution, visit the product page at https://www.cadence.com/modus