• Skip to main content
  • Skip to search
  • Skip to footer
Cadence Home
  • This search text may be transcribed, used, stored, or accessed by our third-party service providers per our Cookie Policy and Privacy Policy.

  1. Blogs
  2. Whiteboard Wednesdays
  3. Whiteboard Wednesdays - Scan Compression Fundamentals
References4U
References4U

Community Member

Blog Activity
Options
  • Subscribe by email
  • More
  • Cancel
Whiteboard Wednesdays
modus
Scan Compression

Whiteboard Wednesdays - Scan Compression Fundamentals

23 Apr 2019 • Less than one minute read

In this week's Whiteboard Wednesdays video, Industry expert Rohit Kapur introduces the basic concepts of digital IC scan compression. Topics explained include the impacts of test application time and test data volume on test cost and the problems solved by implementing scan compression. To learn about the Cadence Modus DFT Software Solution, visit the product page at https://www.cadence.com/modus

Attachment:

  • wbw-rohit-kapur.jpg
  • View
  • Hide

© 2025 Cadence Design Systems, Inc. All Rights Reserved.

  • Terms of Use
  • Privacy
  • Cookie Policy
  • US Trademarks
  • Do Not Sell or Share My Personal Information