How to access the auto calculation command or function of some devices' second-order parameters (e.g., SCA), better in command line form?

Hey smart guys,

As you know, if you change the w, l and nf, and enable the WPE effects for lower-than-CMOS90nm technology MOSFET device, you can see the SCA/SCB/SCC are auto-calculated and reflected through the device property window. And if you change w and nf, the SCA dynamically updates. That means, when you change the w and nf, a black box function is called to do the calculation of such second-order parameters. If you only calculate couples of SCA based on few different w and nf, you can let the property window do it for you manually (i.e., GUI-based approach). If you have 1000 test cases, how can you do this? Is there a command line based approach that when you specify a change of w and nf in a netlist maybe, and you proceed to call a certain command or a function to do the calculation of SCA and then get the SCA value back annotated to the netlist to have the netlist consider the WPE effect?

Because the device property window have such dynamics, so behind the GUI, there must be a function called. Or I guess it kind of finds the corresponding SCA value through the foundry provided model. In this case, the Cadence must have a search or map function operated on the foundry model to be dynamic in terms of SCA calculation.

Any knowledge is appreciated.

Thanks,

Alex