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Question about measuring noise

dskang

Hello,

I'm trying to measure noise power of the mosfet device, and I've done simulation like this:

The plot is the output noise. Can I say this as noise powers generated at the MOSFET? About the MOSFET this is the Verilog-a model and I added noise sources arbitrarily with "whitenoise" function.

I'm not sure I've done an appropriate simulation.

Thank you in advance.

Sincerely,

Dongsuk Kang

  • Hi....you can't gauge noise with a transistor as the yield. You can gauge the yield commotion at a hub, or testing a port (in which case it gives the clamor voltage across the port, yet would then be able to prohibit the clamor in the heap when registering commotion figure), or examining a resistor or a voltage source/iprobe, in which case it will quantify the yield clamor current.

    Thus, you can gauge the noise voltage at an appropriate point, and afterward take a gander at the clamor commitments from the semiconductor (either with the outcomes >print->noise rundown, or with the outcomes program).

  • in reply to ChanceTran

    I've no idea what tool @ChanceTran is talking about because I don't recognise the terms "clamor voltage" or "prohibit the clamor in the heap when registering commotion figure", or what the "outcomes program" is.

    However, the original request can be achieved by turning on the "Noise Separation" checkbox at the bottom of the noise "Choosing Analysis" form. Then on the direct plot form you can plot the normal output referred noise, but also the noise contributors at the device itself and the gain from those contributors to the output.

    Andrew

  • in reply to Andrew Beckett

    Dear Andrew,

    Thank you for the advice. I'll have to re-check that I've done like what you said.

    Regards,

    Dongsuk

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