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re-using schematic based device current measurement in a extracted view.

Newmedia

Hello all,

 I have a current measurement like this in my ade-xl measurement.

OP("/Ibias/MP_ka_ref_cas" "table_ids")

 The problem is that this does not work anymore in extracted view based simulations, since the transistor is splited into multiple devices.

Is there a way to handle this problem.

Thank you,

JW 

Parents

  • I was going to suggest the same as Bernd. There is some support for out-of-context access of operating point data, but that's only with QRC (the Cadence extraction tool), not with third-party extraction tools.

    In general it's non-trivial because it would need to know what kind of quantity the operating point parameter was to know how to recombine it - should it sum them (e.g. for currents), treat them as impedances in parallel, give one of the values (e.g. for voltages), etc etc.

    So best if you can let your LVS/extraction combination combine parallel devices if it can.

    Regards,

    Andrew.

Reply

  • I was going to suggest the same as Bernd. There is some support for out-of-context access of operating point data, but that's only with QRC (the Cadence extraction tool), not with third-party extraction tools.

    In general it's non-trivial because it would need to know what kind of quantity the operating point parameter was to know how to recombine it - should it sum them (e.g. for currents), treat them as impedances in parallel, give one of the values (e.g. for voltages), etc etc.

    So best if you can let your LVS/extraction combination combine parallel devices if it can.

    Regards,

    Andrew.

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