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monte carlo simulations on instance/output parameters

reliability

Hi, I am using ADEXL to conduct MC statistial simulations.I know it is easy to do MC simulation on model paramters like Vth by adding statistical distribution in model card. however, here I need to statistically simulate instance parameters like Leff, width of the nmos...  is there any way to do it？ thank You in advance

Ps. Is there anyway to do MC simulations on other variables like power supply ?

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  •  Hi,

     you can vary any parameter you want by just providing a statistic section for it inside an included model file.

    For example: Instead of giving   1k  to an analogLib resistor  you write   1k*x   and create a statistic for "x".

    The problem is, you want use several instances of that res and apply a different "x" variation. In that case you need to push
    the "x" into a subcircuit, means you need to create an additional schematic/symbol for that resistor cell. Placing the resistor and pins in the schematic and parameterizing the value with  pPar("res")*x. The you create the symbol for it.

    If you have a support account you can check:

     http://support.cadence.com/wps/mypoc/cos?uri=deeplinkmin:ViewSolution;solutionNumber=11485928;searchHash=7263fedf02d98d96b59c2a2254744246

    Kind regards,

    Marc

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  •  Hi,

     you can vary any parameter you want by just providing a statistic section for it inside an included model file.

    For example: Instead of giving   1k  to an analogLib resistor  you write   1k*x   and create a statistic for "x".

    The problem is, you want use several instances of that res and apply a different "x" variation. In that case you need to push
    the "x" into a subcircuit, means you need to create an additional schematic/symbol for that resistor cell. Placing the resistor and pins in the schematic and parameterizing the value with  pPar("res")*x. The you create the symbol for it.

    If you have a support account you can check:

     http://support.cadence.com/wps/mypoc/cos?uri=deeplinkmin:ViewSolution;solutionNumber=11485928;searchHash=7263fedf02d98d96b59c2a2254744246

    Kind regards,

    Marc

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