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monte carlo simulations on instance/output parameters

reliability

Hi, I am using ADEXL to conduct MC statistial simulations.I know it is easy to do MC simulation on model paramters like Vth by adding statistical distribution in model card. however, here I need to statistically simulate instance parameters like Leff, width of the nmos...  is there any way to do it？ thank You in advance

Ps. Is there anyway to do MC simulations on other variables like power supply ?

Parents

  • thank you very much for your detailed answer, Marc!

     

    Another question is Width of the devices is a design variable is unlike threshold voltage which is defined in the model card. I tried to add the process/mismatch for width/VDD distribution in the model card, but my output does not change at all...Actually if i change the width/VDD by sweeping simulation instead of MC simulations , the output actually changes a lot... it seems to me the the statistical sentences controling the distribution of width is not affecting the MC simultion.....Do you know the answer to that?

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  • thank you very much for your detailed answer, Marc!

     

    Another question is Width of the devices is a design variable is unlike threshold voltage which is defined in the model card. I tried to add the process/mismatch for width/VDD distribution in the model card, but my output does not change at all...Actually if i change the width/VDD by sweeping simulation instead of MC simulations , the output actually changes a lot... it seems to me the the statistical sentences controling the distribution of width is not affecting the MC simultion.....Do you know the answer to that?

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