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Changing the corner state of individual MOS in Spectre

RFStuff

Dear All,

 I want to change the corner test of individual MOS. PDK has SS,FF,FS,SF,TT corners.

But the problem is :- If I use let's say SF, then all NMOS transistors are in S corner and all PMOSes are in F corner.

What I want is:-

  Let's say I have PM1,NM1,PM2,NM2 in my circuit.

 I want PM1:-S NM1:-F PM2:-T NM2:-S corners.

 How this can be achieved ?

Kind Regards,

  • I'm struggling to understand why you would want to do this.  The models represent the global process variation which should be fairly consistent across the die.  While there will be minor variations from device to device, you should never see as much variation as is typically seen between different process corners.  Mismatch analysis or Monte Carlo simulations with mismatch variation applied would be a more usual way to analyze this situation.

     Regards,

    TOM

  • Like Tom, I can't work out why you'd want to do this. The only scenario I can think of that would make sense is if you have two blocks which aren't on the same chip - but you want to simulate the interaction between the two and check if one die is in one corner, and the other die is in another. You can do that with the "MTS" capability in ADE XL. But that won't help you to pick different corners for individual transistor instances which would be a really odd thing to do.

    Regards,

    Andrew.

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