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How to acces leaf-instance of subsckt for use as probe?

Hi,

This article https://support.cadence.com/apex/ArticleAttachmentPortal?id=a1Od0000000tt0rEAA describes how to use probes of metal resistors as probes for differential stability analysis.

However, the metal resistors of our PDK is of the subsckt type (which I assume is not a leaf instance?). Inside there is a r1 that is a 'base' resistor.

I've unsuccefully tried all sorts of naming, to get the terminals of the r1, which I assume would get the leaf instance required, but with no luck.

Is there a way to use a component inside a subsckt for stability analysis?

Br,

Christian

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virtuoso 6.1.8.isr29
spectre 21.1.0.484.isr11

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