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Using custom variables in IE cards

djg42085

Is it possible define a variable that can be used in an IE card parameter (specifically Ra) that I could use as a parameter sweep or corner simulation?

I have a RNM that uses EEnets in an VI converter that is part of an oscillator. The net in question is part of a transistor level simulation and requires me to set Ra in order to get the correct V-I conversion...Unless I set this IE, any electrical resistance I put on the net is not properly resolved. I would like to be able to parameterize Ra such that I can run my oscillator across corners.  

Currently, I am running multiple tests each with their own IE cards in an assembler view.  This method works but I would prefer to not have to maintain multiple tests.

thanks, 

DJG

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