Stats

  • Locked Locked
  • Replies 1
  • Subscribers 125
  • Views 3233
  • Members are here 0
This discussion has been locked.
You can no longer post new replies to this discussion. If you have a question you can start a new discussion

Issue with Spectre reliability analysis (negative aging)

Amel

Dear community !

While running Reliability Simulation  on Spectre, I am getting the following warning   this WARNING (SPECTRE-17380): An inconsistent bias 'vdd'='1.800000' in 'model pch.16' has been specified for MOSFET type 'p'. The value will be automatically rectified to '-1.800000' by default, unless  'correct_bias_voltage = no' set in 'output_subckt_degrad' or 'output_device_degrad'.

causing thereby a negative aging 
WARNING (SPECTRE-16824): Reliability simulation iteration 1 terminated prematurely because of the following error(s):

Error found by spectre during transient analysis `tran', during Reliability Analysis `rel'.
ERROR (SPECTRE-17164): The value of parameter 'del_vth' after aging is a negative value '-0.491439' for device 'I0.M1'. Check the aging model and rerun the simulation.

knowing that I am using an aging model and a URI lib which worked well in the past.

Any suggestions to fix these issues 

Parents Reply Children
No Data

Community Guidelines

The Cadence Design Communities support Cadence users and technologists interacting to exchange ideas, news, technical information, and best practices to solve problems and get the most from Cadence technology. The community is open to everyone, and to provide the most value, we require participants to follow our Community Guidelines that facilitate a quality exchange of ideas and information. By accessing, contributing, using or downloading any materials from the site, you agree to be bound by the full Community Guidelines.