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PVT corner for worst case power analysis

archive
archive over 18 years ago

Hello,

I am not sure about what PVT corner I should use for worst case power analysis. I have identified two things in LIB files which are affected by PVT corner selection and affects power analysis:

  • K_factors for internal and leakage power;

  • Transition time.

Temperature selection is ok! When we increase temperature we increase power consumption since both k_factors and transition time are directly proportional to temperature (power consumption of a cell depends on input transition time)

The problem is for process and voltage selection:

  • Transition time decreases when we increase operating voltage (inversely proportional), in contrast of k_factors. So, I should select low or high voltage for worst case power analysis?

  • Transition time increases when we increase process value (directly proportional), in contrast of k_factors. So, I should select low or high process for worst case power analysis?

Besides that, most of LIB files describes PVT corners only for STA and these corners are different for power analysis. So, it is needed define new corners in LIB files to perform worst case power analysis?

Anyone can help me?
Thanks in advance...

 


Originally posted in cdnusers.org by clsantos
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    archive over 18 years ago

    I agree with you that simulation based analysis depends a lot on used testcases. I think is a good idea develop specific testcases for power analysis.

    Concerning PVT for power analysis, I think if you have a power constraint, for example, you need to know if your design can reach this constraint and so worst case power consumption is important.
    In addition to that, worst case power analysis will give you the worst case IR drop and as far as I know it is needed to run STA considering this worst case IR drop (I have another doubt concerning STA using results of IR drop analysis, but I will post it in another topic).

    Your felling seems to be correct, the worst case power analysis if for worst voltage and temperature and best process (I will post the results for all corners analysis as soon as I organize them).

    Regards,
    Cristiano L. Santos


    Originally posted in cdnusers.org by clsantos
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  • archive
    archive over 18 years ago

    I agree with you that simulation based analysis depends a lot on used testcases. I think is a good idea develop specific testcases for power analysis.

    Concerning PVT for power analysis, I think if you have a power constraint, for example, you need to know if your design can reach this constraint and so worst case power consumption is important.
    In addition to that, worst case power analysis will give you the worst case IR drop and as far as I know it is needed to run STA considering this worst case IR drop (I have another doubt concerning STA using results of IR drop analysis, but I will post it in another topic).

    Your felling seems to be correct, the worst case power analysis if for worst voltage and temperature and best process (I will post the results for all corners analysis as soon as I organize them).

    Regards,
    Cristiano L. Santos


    Originally posted in cdnusers.org by clsantos
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