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voltage storm IR drop analysis

Moongon
Hi all, I'm doing voltage storm IR drop analysis embedded in SoC Encounter tool. When I used Encounter's power tool (power -> early analysis -> simulation-based), I can see the IR drop by adjusting threshold. But when I use voltage storm, everything falls into a single bin, no IR drop at all, regardless of threshold. What can be problems? Any suggestions?

  • Hi Mongoon,

    I believe you want to send this to the Digital Implementation Community Forum

     gh-

  • Now I have a working one which shows IR drop. But in some cases, the same error happens. I looked into log file, and I found something interesting. During voltage storm analysis, "checking the connectivity of the circuit" shows up, which is followed by Connect_size[0] = 1 Connect_size[1] = 248 Connect_size[61] = 40 and more of these. It seems voltage storm uses only "Connect_size[1] = 248" for analysis, which means it uses only 248 data values. But, the working one have only two connect size, for example, Connect_size[0] = 1 Connect_size[1] = 14244 And it uses 14244 data values for IR drop analysis. What is the connect_size? And how can I overcome this?

  • Multiple connect size suggests there are connectivity issues (un-related to the IR drop bins). For binning IR values you can use the filter IR command. Please look at the User manual for more information.

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