In my design, there is an one hold violation on scan path, test data is corrupted during scan cycles (when i run verilog simulation of test vectors). I created constraint 'falsepath' to 'TI' input of violated flop and load it into Modus, but this does not have effect.
Can enyone explain to me, does 'falsepath' constraint affects scan path (from Q to TI/SI input, i.e. during SCAN procedure) or this constraint is only for functional mode (ie affects TEST cycle only - to 'D' input)?
I hope resolve this problem this by using some modus design constraints or any other method.