Is it possible to create a spec for a test signal that is dynamic? Say you have a requirement to a signal that is based on what your supply is, ie. the output should be < Vdd*0.7.
I have been able to achieve this by creating a seperate test for each supply I have, and add numerical values in the Spec column in Outputs Setup. However, I feel that this is a workaround which is not optimal. My supply is set by a variable, so what I really want to do is add a list of supply values in the Design Variables in Corner Setup and have a Spec that is based on a this parameter.
The ability to have parameterized specs is due to be coming in IC616.
In the meantime, adjust your expression to include the variable spec - e.g. do originalMeasureExpression-theSpecExpression > 0 (i.e. set the spec to 0, and subtract the varying spec from your expression). Not ideal, but it works...
It's due in May.
Has 6.16 been released yet?
IC616 was released just over 3 weeks ago, but I was a bit premature in saying that this would be part of IC616. It's not in the initial IC616 release; most likely this will be in IC616 ISR3. The work to implement this so that it works everywhere has been quite extensive, and has involved some fairly hefty rearchitecting, so wasn't ready in time for the initial IC616 release. In general we tend to stage new features in the ADE tools so that they come in every few (typically 3) ISRs to allow for increased testing by AEs and customers prior to release, hence the likely timeline of ISR3. This is not a promise, by the way, as it will depend on testing by AEs to and Product Engineering to ensure that the use model makes sense and it is of sufficient quality to enable the release.