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  3. Peak and average IR drop analysis mode

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Peak and average IR drop analysis mode

archive
archive over 18 years ago

Hello,

I am not sure about what means peak and average IR drop mode analysis in Encounter. What of these two analysis modes should be considered for power plan optimization?

I have a small block design (5K gates) operating at very low frequency (640 KHz) and there is a big difference between the results of these two analysis modes:

  • worst IR drop average analysis: 9.8035e-05 v

  • worst IR drop peak analysis: 4.3088e-01 v

Is average analysis frequency dependent? But voltage drop is not event dependent and so can cause timing problems also at low frequencies?

Thanks in advance.

 


Originally posted in cdnusers.org by clsantos
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  • archive
    archive over 18 years ago

    Hi Clsantos,

    I think it is impossible to optimise for peak analysis. Look at the peak current; you will need hurndreds of micro width power stripe.

    Take a look at data sheet for a RAM, and you can see that the peak read/write power is huge.

    To reduce the peak current, a method is to purposely de-skew the clock so that not all logic are toggling at the same time, but this method is not too popular. You can also put some moscap (as filler cell) to reduce the IR drop. Other methold are in the design, like not to write to all memories at once (e.g. during MBIST, don't test all memory at one go).

    Anyone has encountered problem with peak IR drop in real chip?

    Regards,
    Eng Han


    Originally posted in cdnusers.org by EngHan
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  • archive
    archive over 18 years ago

    Hi Clsantos,

    I think it is impossible to optimise for peak analysis. Look at the peak current; you will need hurndreds of micro width power stripe.

    Take a look at data sheet for a RAM, and you can see that the peak read/write power is huge.

    To reduce the peak current, a method is to purposely de-skew the clock so that not all logic are toggling at the same time, but this method is not too popular. You can also put some moscap (as filler cell) to reduce the IR drop. Other methold are in the design, like not to write to all memories at once (e.g. during MBIST, don't test all memory at one go).

    Anyone has encountered problem with peak IR drop in real chip?

    Regards,
    Eng Han


    Originally posted in cdnusers.org by EngHan
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