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Library Characterization_ Simulation setup file

Hi,

I am characterizing 90nm custom cells using encounter library characterizer. When creating simulation setup file, I have some questions about the parameter values.

*Does the default values mention in the ELC documentation works for 90nm process or they are independent of the process technology.

*What values to select for slew rate and load capacitance

*How to make room of calculating cell delay while characterizing the cells.

I am attaching simulation setup filefor consideration.

Thanks in advance

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