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Statistical Contribution or criticality of each device

Charanraj Mohan

Hello,

 Suppose we are running a Monte Carlo simulation & we are interested to find which MOSFET device is critical, is it possible to find out every MOSFET's contribution to criticality of mismatch, like how we get in a 'Noise Summary' for a noise simulation ????

Thanks in advance Slight smile

  • Yes. In ADE XL (it's actually an ADE GXL licensed feature) or in Assembler/Explorer (there it's a Virtuoso Variation Option feature) there's the "mismatch contribution' icon (which is a sort of circular icon towards the right end of the results icons). This computes the contribution of the mismatch variation of a device to the variation of the measured output. It's considerably more complicated than noise contribution.

    There is also the possibility to do this with dcmatch analysis, but that's then a dc sensitivity analysis rather than monte carlo - so you can't look at the contribution to arbitrary values. More details are in the Art of Analog Design blogs - in particular this edition (you might want to search in the community for "Art of Analog Design" for all of them).

    Regards,

    Andrew

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