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Cadence distinguished engineer Rohit Kapur introduces diagnostic capabilities in IC testing. Kapur explains the metrics used to evaluate diagnostics tools and discusses why the Cadence Modus DFT Software Solution is the industry-leading solution. For more information, please visit www.cadence.com/modus

https://youtu.be/Q-j1t64DwoU

While most of us would like our electronic gadgets to last forever, the reality is that these gadgets have a lifetime. Most of the time, the lifetime of devices is limited by either mechanical (switch, relay), or thermal (fuse, capacitor) failures. However, as microchips designed in advanced technologies become more pervasive, the lifetime of microchips has become an additional issue.

Several effects contribute to device…

In this week’s Whiteboard Wednesdays, Pierre-Xavier Thomas introduces the B10 and B20 as a complement to the ConnX family with higher performance and additional features to support new wireless communications standard and high-resolution radar/lidar applications.

https://youtu.be/MaWYNbOEbMo

Analog and Mixed-signal (AMS) designs are increasingly using active power management to minimize power consumption. Typical mixed-signal design uses several power domains and operate in a dozen or more power modes including multiple functional, standby and test modes. To save power, parts of design not active in a mode are shut down or may operate at reduced supply voltage when high performance is not required. These…

In this week's Whiteboard Wednesdays video, distinguished Engineer Rohit Kapur introduces the concept of scan testing and gives an overview of the Modus DFT Software Solution and Genus Synthesis Solutions from Cadence. Learn the basic steps of Design for Test (DFT) including scan design, test pattern generation (ATPG), and fault simulation.  For more information, read the datasheet and visit the product page at www…